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EN 61000-4-11 Testing – Dips, Interruptions & Voltage Variations Immunity

The EN 61000-4-11 test standard defines the immunity test methods and range of preferred test levels for electrical and electronic equipment. Additionally, the equipment must be connected to low-voltage power supply networks for voltage dips, short interruptions, and voltage variations. 

The scope of EN 61000 4 11 testing evaluates the immunity of electrical and electronic equipment. This is carried out only when subjected to voltage dips, short interruptions, and voltage variations.

The EN 61000 4 11 test standard states that electrical and electronic equipment may be affected by voltage dips, short interruptions, or voltage variations of power supply. Voltage dips and short interruptions are caused by faults in the network. Faults are primarily short circuits, in installations or by sudden large changes of load. These phenomena are random and can be minimally characterized for laboratory simulation in terms of the deviation from the rated voltage and duration.

Expert EN 61000-4-11 EMC Compliance Laboratory

Keystone Compliance is recognized as a leading EN 61000-4-11 test lab. With five EMC test chambers and six ground plane surfaces, lead times for scheduling are short. Testing is streamlined and having dedicated report writers, EMC test reports are typically distributed within one week after testing is complete.

The primary reason why so many manufacturers have made Keystone Compliance their EN 61000-4-11 testing lab is our engineering guidance. This guidance is found throughout the entire test program.

Our engineers work directly with customers who are experiencing challenges in meeting the EMC test requirements. With vast experience in testing, our team can quickly identify the issues and suggest corrections. Our EMC design guidance is unparalleled.

Please contact us for more information on how Keystone Compliance can assist you with identifying and fulfilling your IEC 61000-4-11 test, EN 61000 4 11 test, and immunity test needs.